Long time stability of ITO/NiPc/ZnO/Al devices with ZnO buffer layer formed by atomic layer deposition technique–impedance spectroscopy analysis
Titel:
Long time stability of ITO/NiPc/ZnO/Al devices with ZnO buffer layer formed by atomic layer deposition technique–impedance spectroscopy analysis
Auteur:
Stakhira, Pavlo Y. Grygorchak, Ivan I. Cherpak, Vladyslav V. Ivastchyshyn, Fedir O. Volynyuk, Dmytro Y. Luka, Grzegorz Godlewski, Marek Guziewicz, Elzbieta Pakhomov, Georgi L. Hotra, Zenon Y.
Verschenen in:
Materials science and engineering. B, Solid-state materials for advanced technology