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Journal description
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Details for article 17 of 40 found articles
| Title: |
Impurity interaction with point defects in the Si–SiO2 structures and its influence on the interface properties |
| Author: |
Kropman, D. Mellikov, E. Kärner, T. Ugaste, Ü. Laas, T. Heinmaa, I. Medvid, A. |
| Appeared in: |
Materials science and engineering. B, Solid-state materials for advanced technology |
| Paging: | Volume 134 (2006) nr. 2-3 pages 5 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 40 found articles
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