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Journal description
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Details for article 3 of 21 found articles
| Title: |
A theoretical analysis of sensitivity in semiconductor measurement by microwave photoconductance decay |
| Author: |
Chen, F.X. Cui, R.Q. Xu, L. |
| Appeared in: |
Materials science and engineering. B, Solid-state materials for advanced technology |
| Paging: | Volume 116 (2005) nr. 2 pages 7 p. |
| Year: |
2005 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 21 found articles
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