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                                       Details for article 18 of 18 found articles
 
 
  XPS, AFM and nanoindentation studies of Ti1−x Al x N films synthesized by reactive unbalanced magnetron sputtering
 
 
Title: XPS, AFM and nanoindentation studies of Ti1−x Al x N films synthesized by reactive unbalanced magnetron sputtering
Author: Shum, P.W.
Zhou, Z.F.
Li, K.Y.
Shen, Y.G.
Appeared in: Materials science and engineering. B, Solid-state materials for advanced technology
Paging: Volume 100 (2003) nr. 2 pages 10 p.
Year: 2003
Contents:
Publisher: Elsevier Science B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 18 of 18 found articles
 
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