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In situ synchrotron X-ray diffraction analysis of two-way shape memory effect in Nitinol |
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Titel: |
In situ synchrotron X-ray diffraction analysis of two-way shape memory effect in Nitinol |
Auteur: |
Wang, Zifan Zhang, Yunlan Liogas, Konstantinos Chen, Jingwei Vaughan, Gavin B.M. Kocich, Radim Kunčická, Lenka Uzun, Fatih You, Zhong Korsunsky, Alexander M. |
Verschenen in: |
Materials science and engineering. A, Structural materials: properties, microstructure and processing |
Paginering: |
Jaargang 878 () nr. C pagina's p. |
Jaar: |
2023 |
Inhoud: |
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Uitgever: |
The Authors |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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