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Journal description
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Details for article 43 of 61 found articles
| Title: |
Parametric atomistic analysis of dislocation–interface interactions in thin metallic films |
| Author: |
Shen, Y.-L. Leger, R.W. |
| Appeared in: |
Materials science and engineering. A, Structural materials: properties, microstructure and processing |
| Paging: | Volume 423 (2006) nr. 1-2 pages 5 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 43 of 61 found articles
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