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Journal description
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Details for article 84 of 803 found articles
| Title: |
Application of charge regulation model for evaluation of surface ionization parameters from atomic force microscopy (AFM) data |
| Author: |
Zhmud, B.V. Meurk, A. Bergström, L. |
| Appeared in: |
Colloids and surfaces. A, Physicochemical and engineering aspects |
| Paging: | Volume 164 (2000) nr. 1 pages 5 p. |
| Year: |
2000 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 84 of 803 found articles
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