|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 4 of 12 found articles
| Title: |
An optimal design of accelerated life test for exponential distribution |
| Author: |
Bai, D.S. Chung, S.W. |
| Appeared in: |
Reliability engineering & system safety |
| Paging: | Volume 31 (1991) nr. 1 pages 8 p. |
| Year: |
1991 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 12 found articles
| << previous | next >> |