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                                       Details for article 8 of 12 found articles
 
 
  Forensic application of total reflection X-ray fluorescence spectrometry for elemental characterization of ink samples
 
 
Title: Forensic application of total reflection X-ray fluorescence spectrometry for elemental characterization of ink samples
Author: Dhara, Sangita
Misra, N.L.
Maind, S.D.
Kumar, Sanjukta A.
Chattopadhyay, N.
Aggarwal, S.K.
Appeared in: Spectrochimica acta. Part B, Atomic spectroscopy
Paging: Volume 65 (2010) nr. 2 pages 4 p.
Year: 2010
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 8 of 12 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands