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Journal description
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Details for article 7 of 16 found articles
| Title: |
Erratum to “Depth-profiling of vertical sidewall nanolayers on structured wafers by grazing incidence X-ray fluorescence” [Spectrochim. Acta Part B 63 (2008) 1359–1364] |
| Author: |
Hönicke, P. Beckhoff, B. Kolbe, M. List, S. Conard, T. Struyff, H. |
| Appeared in: |
Spectrochimica acta. Part B, Atomic spectroscopy |
| Paging: | Volume 64 (2009) nr. 3 pages 1 p. |
| Year: |
2009 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 16 found articles
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