Total-reflection X-ray fluorescence spectrometry, a powerful tool for semiquantitative analysis of archaeological glass samples 1 This paper was presented at the 6th Conference on “Total Reflection X-Ray Fluorescence Analysis and Related Methods” (TXRF '96) held in two parts in Eindhoven (The Netherlands) and Dortmund (Germany) in June 1996, and is published in the Special Issue of Spectrochimica Acta, Part B, dedicated to that Conference. 1
Titel:
Total-reflection X-ray fluorescence spectrometry, a powerful tool for semiquantitative analysis of archaeological glass samples 1 This paper was presented at the 6th Conference on “Total Reflection X-Ray Fluorescence Analysis and Related Methods” (TXRF '96) held in two parts in Eindhoven (The Netherlands) and Dortmund (Germany) in June 1996, and is published in the Special Issue of Spectrochimica Acta, Part B, dedicated to that Conference. 1
Auteur:
Wegstein, M Urban, H Rostam-Khani, P Wittershagen, A Kolbesen, B.O