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Details for article 19 of 36 found articles
| Title: |
Glancing incidence X-ray analysis: more than just reflectivity! 1 This paper was presented at the 6th Conference on “Total Reflection X-Ray Fluorescence Analysis and Related Methods” (TXRF '96) held in two parts in Eindhoven (The Netherlands) and Dortmund (Germany) in June 1996, and is published in the Special Issue of Spectrochimica Acta, Part B, dedicated to that Conference. 1 |
| Author: |
Leenaers, A.J.G Vrakking, J.J.A.M de Boer, D.K.G |
| Appeared in: |
Spectrochimica acta. Part B, Atomic spectroscopy |
| Paging: | Volume 52 (1997) nr. 7 pages 805-812 |
| Year: |
1997 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 36 found articles
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