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  An improved absorption correction based on a Gaussian ionization distribution model for electron probe microanalysis
 
 
Title: An improved absorption correction based on a Gaussian ionization distribution model for electron probe microanalysis
Author: Tanuma, Shigeo
Nagashima, Kozo
Appeared in: Spectrochimica acta. Part B, Atomic spectroscopy
Paging: Volume 36 (1981) nr. 7 pages 5 p.
Year: 1981
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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