|
| next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 1 of 18 found articles
| Title: |
A 3-D simulation model for X-ray path length and yield variation in micro-PIXE analysis of rough surfaces |
| Author: |
Gholami Hatam, Ebrahim |
| Appeared in: |
Spectrochimica acta. Part B, Atomic spectroscopy |
| Paging: | Volume 230 () nr. C pages p. |
| Year: |
2025 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 18 found articles
| next >> |