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Journal description
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Details for article 8 of 9 found articles
| Title: |
RVE-based studies on the coupled effects of void size and void shape on yield behavior and void growth at micron scales |
| Author: |
Li, Zhenhuan Steinmann, Paul |
| Appeared in: |
International journal of plasticity |
| Paging: | Volume 22 (2006) nr. 7 pages 22 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 9 found articles
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