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                                       Details for article 1 of 31 found articles
 
 
  AES depth profiling with N2 + ion sputtering
 
 
Title: AES depth profiling with N2 + ion sputtering
Author: Windawi, H.M.
Katzer, J.R.
Cooper, C.B.
Appeared in: Physics letters. A
Paging: Volume 59 (1976) nr. 1 pages 3 p.
Year: 1976
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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