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Details for article 475 of 4350 found articles
| Title: |
Characterization of molecular organization in pentacene thin films on SiO2 surface using infrared spectroscopy, spectroscopic ellipsometry, and atomic force microscopy |
| Author: |
Frątczak, E.Z. Uznański, P. Moneta, M.E. |
| Appeared in: |
Chemical physics |
| Paging: | Volume 456 (2015) nr. C pages 8 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 475 of 4350 found articles
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