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Journal description
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Details for article 2 of 23 found articles
| Title: |
Analysis of depth-sectioning STEM for thick samples and 3D imaging |
| Author: |
Bosch, Eric G.T. Lazić, Ivan |
| Appeared in: |
Ultramicroscopy |
| Paging: | Volume 207 (2019) nr. C pages p. |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 23 found articles
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