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Journal description
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Details for article 3 of 14 found articles
| Title: |
A versatile double aberration-corrected, energy filtered HREM/STEM for materials science |
| Author: |
Hutchison, John L. Titchmarsh, John M. Cockayne, David J.H. Doole, Ron C. Hetherington, Crispin J.D. Kirkland, Angus I. Sawada, H. |
| Appeared in: |
Ultramicroscopy |
| Paging: | Volume 103 (2005) nr. 1 pages 9 p. |
| Year: |
2005 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 14 found articles
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