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Details for article 1 of 11 found articles
| Title: |
A robust ESD event locator system with event characterization 1 © 1997. Reprinted with permission, after revision, from Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS-19, Santa Clara, CA, USA, September 23–25, 1997. 1 |
| Author: |
Lin, Don L. DeChiaro, Louis F. Jon, Min-Chung |
| Appeared in: |
Journal of electrostatics |
| Paging: | Volume 44 (1998) nr. 3-4 pages 17 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 11 found articles
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