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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 3 of 23 found articles
| Title: |
Annealing of ESD-induced damage in power MOSFETs |
| Author: |
Zupac, D. Pote, D. Schrimpf, R.D. Galloway, K.F. |
| Appeared in: |
Journal of electrostatics |
| Paging: | Volume 31 (1993) nr. 2-3 pages 14 p. |
| Year: |
1993 |
| Contents: | |
| Publisher: |
Elsevier Science Publishers B.V. All rights reserved. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 23 found articles
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