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Journal description
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Details for article 2 of 110 found articles
| Title: |
A comprehensive study of MEMS behavior under EOS/ESD events: Breakdown characterization, dielectric charging, and realistic cures |
| Author: |
Tazzoli, Augusto Barbato, Marco Ritrovato, Vincenzo Meneghesso, Gaudenzio |
| Appeared in: |
Journal of electrostatics |
| Paging: | Volume 69 (2011) nr. 6 pages 7 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 110 found articles
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