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                                       Details for article 48 of 129 found articles
 
 
  Excimer laser cleaning of Si(100) surfaces at 193 and 248 nm studied by LEED, AES and XPS spectroscopies
 
 
Title: Excimer laser cleaning of Si(100) surfaces at 193 and 248 nm studied by LEED, AES and XPS spectroscopies
Author: Larciprete, R.
Borsella, E.
Appeared in: Journal of electron spectroscopy and related phenomena
Paging: Volume 76 (1995) nr. C pages 6 p.
Year: 1995
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 48 of 129 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands