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Journal description
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Details for article 44 of 129 found articles
| Title: |
Elemental and chemical microanalysis of silicon surfaces by reflected electron energy loss microscopy and scanning Auger microscopy |
| Author: |
Paparazzo, E |
| Appeared in: |
Journal of electron spectroscopy and related phenomena |
| Paging: | Volume 76 (1995) nr. C pages 5 p. |
| Year: |
1995 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 44 of 129 found articles
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