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Journal description
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Details for article 4 of 6 found articles
| Title: |
Comparative Ab initio analysis of valence XPS data for acenes and paraphenyl oligomers: Application of the molecular-orbital intensity model |
| Author: |
Boutique, J.P. Riga, J. Verbist, J.J. Delhalle, J. Fripiat, J.G. |
| Appeared in: |
Journal of electron spectroscopy and related phenomena |
| Paging: | Volume 33 (1984) nr. 3 pages 20 p. |
| Year: |
1984 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 6 found articles
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