Quantitative study of valence and configuration interaction parameters of the Kondo semiconductors CeM2Al10 (M=Ru, Os and Fe) by means of bulk-sensitive hard X-ray photoelectron spectroscopy
Titel:
Quantitative study of valence and configuration interaction parameters of the Kondo semiconductors CeM2Al10 (M=Ru, Os and Fe) by means of bulk-sensitive hard X-ray photoelectron spectroscopy
Auteur:
Strigari, F. Sundermann, M. Muro, Y. Yutani, K. Takabatake, T. Tsuei, K.-D. Liao, Y.F. Tanaka, A. Thalmeier, P. Haverkort, M.W. Tjeng, L.H. Severing, A.
Verschenen in:
Journal of electron spectroscopy and related phenomena