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Journal description
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Details for article 3 of 15 found articles
| Title: |
Azimuthal angular-dependent XPS studies using the AEI (Kratos) instrument |
| Author: |
Evans, Stephen |
| Appeared in: |
Journal of electron spectroscopy and related phenomena |
| Paging: | Volume 19 (1980) nr. 1 pages 4 p. |
| Year: |
1980 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 15 found articles
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