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                                       Details for article 11 of 15 found articles
 
 
  Non-destructive compositional depth profile in the tens-of-nanometer scale
 
 
Title: Non-destructive compositional depth profile in the tens-of-nanometer scale
Author: Rubio-Zuazo, J.
Ferrer, P.
Castro, G.R.
Appeared in: Journal of electron spectroscopy and related phenomena
Paging: Volume 180 (2010) nr. 1-3 pages 7 p.
Year: 2010
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 11 of 15 found articles
 
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