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Journal description
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Details for article 13 of 14 found articles
| Title: |
Thickness dependence of X-ray absorption and photoemission in Fe thin films on Si(0 0 1) |
| Author: |
Gao, Xingyu Qi, Dongchen Tan, Swee Ching Wee, A.T. S. Yu, Xiaojiang Moser, Herbert O. |
| Appeared in: |
Journal of electron spectroscopy and related phenomena |
| Paging: | Volume 151 (2006) nr. 3 pages 5 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 13 of 14 found articles
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