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Journal description
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Details for article 19 of 20 found articles
| Title: |
Use of angle-resolved XPS to determine depth profiles based on Fick’s second law of diffusion: description of method and simulation study |
| Author: |
Diao, Jie Hess, Dennis W. |
| Appeared in: |
Journal of electron spectroscopy and related phenomena |
| Paging: | Volume 135 (2004) nr. 2-3 pages 18 p. |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 20 found articles
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