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Journal description
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Details for article 7 of 18 found articles
| Title: |
Expanding the view into complex material systems: From micro-ARPES to nanoscale HAXPES |
| Author: |
Schneider, C.M. Wiemann, C. Patt, M. Feyer, V. Plucinski, L. Krug, I.P. Escher, M. Weber, N. Merkel, M. Renault, O. Barrett, N. |
| Appeared in: |
Journal of electron spectroscopy and related phenomena |
| Paging: | Volume 185 (2012) nr. 10 pages 10 p. |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 18 found articles
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