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                                       Details for article 1391 of 1918 found articles
 
 
  Oxide-scale thickness measurement for predicting crack growth history in elevated temperature components
 
 
Title: Oxide-scale thickness measurement for predicting crack growth history in elevated temperature components
Author: Huneycutt IV, Ralph E.
Saxena, Ashok
Yoon, Kee Bong
Appeared in: International journal of pressure vessels and piping
Paging: Volume 161 (2018) nr. C pages 1-9
Year: 2018
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 1391 of 1918 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands