Indirect measurement of high grid strip densities over Nyquist sampling rate based on the moiré pattern analysis for quality assurance in grid manufacturing
Titel:
Indirect measurement of high grid strip densities over Nyquist sampling rate based on the moiré pattern analysis for quality assurance in grid manufacturing
Auteur:
Je, Uikyu Kim, Jinsoo Cho, Hyosung Lim, Hyunwoo Park, Chulkyu Kim, Guna Park, Soyoung Park, Yeonok Kim, Kyuseok Woo, Taeho Chung, Nagkun Kim, Jinwon Kim, Jinguk
Verschenen in:
Measurement
Paginering:
Jaargang 91 (2016) nr. C pagina's 7 p.
Jaar:
2016
Inhoud:
Uitgever:
Elsevier Ltd
Bronbestand:
Elektronische Wetenschappelijke Tijdschriften