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Journal description
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Details for article 52 of 62 found articles
| Title: |
Profile surface roughness measurement using metrological atomic force microscope and uncertainty evaluation |
| Author: |
Misumi, Ichiko Naoi, Kazuya Sugawara, Kentaro Gonda, Satoshi |
| Appeared in: |
Measurement |
| Paging: | Volume 73 (2015) nr. C pages 9 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 52 of 62 found articles
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