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                                       Details for article 10 of 17 found articles
 
 
  Experimental characterization of low-frequency noise in power MOSFETs for defectiveness modelling and technology assessment
 
 
Title: Experimental characterization of low-frequency noise in power MOSFETs for defectiveness modelling and technology assessment
Author: Magnone, Paolo
Traverso, Pier Andrea
Barletta, Giacomo
Fiegna, Claudio
Appeared in: Measurement
Paging: Volume 52 (2014) nr. C pages 8 p.
Year: 2014
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 10 of 17 found articles
 
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