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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 6 of 10 found articles
| Title: |
Residual stress measurement in PVD optical coatings by microtopography |
| Author: |
Costa, Manuel F.M. Teixeira, V. |
| Appeared in: |
Measurement |
| Paging: | Volume 44 (2011) nr. 3 pages 5 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 10 found articles
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