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  Metrology, static and dynamic characterization of microstructures using acousto-optic-modulated-stroboscopic-interferometry
 
 
Title: Metrology, static and dynamic characterization of microstructures using acousto-optic-modulated-stroboscopic-interferometry
Author: Pai, Murali Manohar
Rinaldi, Gino
Packirisamy, Muthukumaran
Sivakumar, Narayanswamy
Appeared in: Measurement
Paging: Volume 42 (2009) nr. 3 pages 9 p.
Year: 2009
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 10 of 18 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands