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Journal description
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Details for article 5 of 6 found articles
| Title: |
Optically interferometric roughness measurements for spherical surfaces by processing two microscopic interferograms |
| Author: |
Chen, Xiaomei Grattan, K.T.V. Dooley, R.Larry |
| Appeared in: |
Measurement |
| Paging: | Volume 32 (2002) nr. 2 pages 7 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 6 found articles
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