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Journal description
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Details for article 53 of 98 found articles
| Title: |
Few-shot image classification for defect detection in aviation materials |
| Author: |
Wu, Zewei Peng, Chengbin |
| Appeared in: |
Measurement |
| Paging: | Volume 253 () nr. PD pages p. |
| Year: |
2025 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 53 of 98 found articles
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