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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 4 of 6 found articles
| Title: |
Deformation and wear of pyramidal, silicon-nitride AFM tips scanning micrometre-size features in contact mode |
| Author: |
Bloo, M.L. Haitjema, H. Pril, W.O. |
| Appeared in: |
Measurement |
| Paging: | Volume 25 (1999) nr. 3 pages 9 p. |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 6 found articles
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