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  Exploration of the transverse seebeck effect in the inclined nitrogen-doped 4H-SiC thin film
 
 
Title: Exploration of the transverse seebeck effect in the inclined nitrogen-doped 4H-SiC thin film
Author: Xie, Tian
Tao, Bowan
Zhao, Ruipeng
Chen, Xi
Li, Zhenzhe
Zhao, Mingyuan
Chen, Wenhao
Appeared in: Measurement
Paging: Volume 243 () nr. C pages p.
Year: 2025
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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