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Details for article 80 of 119 found articles
| Title: |
New IEC standards for the measurement of sheet resistance on large-area graphene using the van der Pauw and the in-line four-point probe methods |
| Author: |
Cultrera, Alessandro Serazio, Danilo Fabricius, Norbert Callegaro, Luca |
| Appeared in: |
Measurement |
| Paging: | Volume 236 () nr. C pages p. |
| Year: |
2024 |
| Contents: | |
| Publisher: |
The Authors |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 80 of 119 found articles
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