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Journal description
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Details for article 4 of 60 found articles
| Title: |
A light-weight defect detection model for capacitor appearance based on the Yolov5 |
| Author: |
Xu, Lei Xu, Xuemei Xia, Qinglin Yao, Yexia Jiang, Zhaohui |
| Appeared in: |
Measurement |
| Paging: | Volume 232 () nr. C pages p. |
| Year: |
2024 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 60 found articles
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