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Journal description
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Details for article 75 of 106 found articles
| Title: |
Perspective estimation of light emitting diode reliability measures based on multiply accelerated long run stress testing backed up by stochastic diffusion process |
| Author: |
Vališ, David Forbelská, Marie Vintr, Zdeněk Tiep La, Quoc Leuchter, Jan |
| Appeared in: |
Measurement |
| Paging: | Volume 206 () nr. C pages p. |
| Year: |
2023 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 75 of 106 found articles
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