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                                       Details for article 75 of 106 found articles
 
 
  Perspective estimation of light emitting diode reliability measures based on multiply accelerated long run stress testing backed up by stochastic diffusion process
 
 
Title: Perspective estimation of light emitting diode reliability measures based on multiply accelerated long run stress testing backed up by stochastic diffusion process
Author: Vališ, David
Forbelská, Marie
Vintr, Zdeněk
Tiep La, Quoc
Leuchter, Jan
Appeared in: Measurement
Paging: Volume 206 () nr. C pages p.
Year: 2023
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 75 of 106 found articles
 
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