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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 46 of 127 found articles
| Title: |
Defect classification on semiconductor wafers using Fisher vector and visual vocabularies coding |
| Author: |
Gómez-Sirvent, José L. López de la Rosa, Francisco Sánchez-Reolid, Roberto Morales, Rafael Fernández-Caballero, Antonio |
| Appeared in: |
Measurement |
| Paging: | Volume 202 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 46 of 127 found articles
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