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Journal description
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Details for article 112 of 117 found articles
| Title: |
Transition imaging phase measuring deflectometry for high-precision measurement of optical surfaces |
| Author: |
Chen, Yunuo Zhang, Xiangchao Chen, Ting Zhu, Rui Ye, Lu Lang, Wei |
| Appeared in: |
Measurement |
| Paging: | Volume 199 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 112 of 117 found articles
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