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Journal description
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Details for article 1 of 7 found articles
| Title: |
Capabilities and limitations of interference microscopy for two- and three-dimensional surface-measuring technology |
| Author: |
Hillmann, W. Brand, U. Krystek, M. |
| Appeared in: |
Measurement |
| Paging: | Volume 19 (1996) nr. 2 pages 8 p. |
| Year: |
1996 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 7 found articles
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