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                                       Details for article 48 of 133 found articles
 
 
  Development of a compact focus variation microscopy sensor for on-machine surface topography measurement
 
 
Title: Development of a compact focus variation microscopy sensor for on-machine surface topography measurement
Author: Santoso, Teguh
Syam, Wahyudin P.
Darukumalli, Subbareddy
Leach, Richard
Appeared in: Measurement
Paging: Volume 187 () nr. C pages p.
Year: 2022
Contents:
Publisher: The Authors
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 48 of 133 found articles
 
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