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                                       Details for article 105 of 133 found articles
 
 
  Precise localization of contaminants in graphene with secondary ion mass spectrometry
 
 
Title: Precise localization of contaminants in graphene with secondary ion mass spectrometry
Author: Michałowski, Paweł Piotr
Kozdra, Sylwia
Pasternak, Iwona
Sitek, Jakub
Wójcik, Adrianna
Strupiński, Włodek
Appeared in: Measurement
Paging: Volume 187 () nr. C pages p.
Year: 2022
Contents:
Publisher: The Authors
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 105 of 133 found articles
 
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