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  A data-driven approach based on wavelet analysis and deep learning for identification of multiple-cracked beam structures under moving load
 
 
Title: A data-driven approach based on wavelet analysis and deep learning for identification of multiple-cracked beam structures under moving load
Author: Nguyen, Thanh Q.
Vuong, Luan C.
Le, Canh M.
Ngo, Nhi K.
Nguyen- Xuan, H.
Appeared in: Measurement
Paging: Volume 162 () nr. C pages p.
Year: 2020
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 2 of 32 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands